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Equipped with a CCD camera!
A semi-automatic device for probing contact on a heater stage to measure the I-L characteristics of a wafer-to-chip vertical-cavity surface-emitting laser (VCSEL-LD).
Automatic measurement of optical and electrical properties is possible! This is an auto-prober compatible with multi-beam VCSELs.
This device is an LD test wafer prober that automatically measures the electrical and optical characteristics of VCSEL laser diodes in wafer form under ambient conditions ranging from room temperature (20°C) to high temperature (95°C). <Features> ■ Automatically measures the characteristics of multi-beam VCSELs in wafer form. ■ Combines ALPHAX's measurement technology with MPI's VCSEL wafer prober. ■ MPI is a leading LED prober manufacturer in Taiwan. ■ Measurement items include I-L, I-V, λ, NFP (OPTION), FFP (OPTION). Continuous measurements are performed for each item with a single unit. ■ Achieves high-speed and high-precision measurements. For more details, please download the PDF or feel free to contact us.
